產(chǎn)品型號(hào)：

HP-4284A、4285A

中賽儀器庫存大量各種高頻儀器現(xiàn)貨特價(jià)出售中--本公司長(zhǎng)期現(xiàn)金大量高價(jià)回收各種高頻儀器;如-網(wǎng)絡(luò)分析儀-視/ 音頻分析儀-信號(hào)發(fā)生器-頻譜分析儀-手機(jī)綜合測(cè)試儀 阻抗分析儀 LCR電橋 示波器 高壓測(cè)試儀 靜電放電發(fā)生器等等…..儀器聯(lián)糸人；張彬11/電話；傳真； 選用二手測(cè)量?jī)x器的優(yōu)勢(shì)是：
1、與新購儀器幾個(gè)月的供貨期相比，購買二手儀器的供貨期要短的多。在 時(shí)間就是市場(chǎng)的今天，優(yōu)勢(shì)無疑是為明顯的。
2、二手儀器的價(jià)格便宜，基本為新購儀器價(jià)格的20%～50%。在電子技術(shù)迅 速發(fā)展的今天，儀器的更新也在加快，投資越少則風(fēng)險(xiǎn)越小。
3、為了讓您放心地使用我們提供的二手儀器，我們銷售的二手儀器可以做到：
1、保修半年至一年不等。
2、可以根據(jù)您的要求，將儀器送至計(jì)量測(cè)試單位進(jìn)行校準(zhǔn)。

Agilent Technologies 4284A Precision LCR Meter

The Agilent 4284A precision LCR meter is a cost-effective solution for component and material measurement. The wide 20 Hz to 1 MHz test frequency range and superior test-signal performance allow the Agilent 4284A to test components to the most commonly-used test standards, such as IEC/MIL standards, and under conditions that simulate the intended application. Whether in research and development, production, quality assurance, or incoming inspection, the Agilent 4284A will meet all of your LCR meter test and measurement requirements.

• 20 Hz to 1 MHz with over with 8610 selectable test frequencies
• Exceptional basic accuracy of 0.05%
• Measures |Z|-theta, |Y|-theta, R-X, G-B, C-D, Q, ESR, G, Rp, L-D, deviation, and deviation %
• DC bias to 2 V
• GPIB

Agilent Technologies 4285A Precision LCR Meter

The Agilent 4285A precision LCR meter is a cost-effective solution for component and material measurement. For demanding RF component tests, the Agilent 4285A offers a higher test-frequency range, from 75 kHz to 30 MHz. Whether in research and development, production, quality assurance, or incoming inspection, the Agilent 4285A will meet all of your LCR meter test and measurement requirements.

• 75 kHz to 30 MHz in 100 Hz steps
• Accuracy to 0.1%
• Measurements include |Z|-theta, |Y|-theta, R-X, G-B, C-D, Q, ESR, G, Rp, L-D, deviation, and deviation %
• Constant V or I test signal level
• 10 ADC with the optional Agilent 42841A
• List sweep measurement capability
• GPIB